New SEM and EBSD by COMTES FHT

mikroskopLast week, a new JEOL IT 500 HR scanning electron microscope was installed at the materiala analysis department. It features a new high-speed EBSD camera and a very sensitive EDS detector from EDAX. The microscope has also a STEM detector that allows an observation of the microstructure of metallic foils in transmission mode.

The hight-speed EBSD camera was co-financed by the European Union, by the European Regional Development Fund within the project 3DCOVER.

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New SEM and EBSD by COMTES FHT

Oct 1, 2018

Last week, a new scanning electron microscope was installed at the material analysis department. It features a new high-speed EBSD camera and a very sensitive EDS detector. ... more

COMAT 2018

Jul 10, 2018

Under the auspices of COMTES FHT a.s. and the company Tanger, spol. s r. o., the 5th international conference COMAT 2018 – Recent Trends in Structural Materials will be held on November 14th-16th in Pilsen. ... more