mikroskopLast week, a new JEOL IT 500 HR scanning electron microscope was installed at the materiala analysis department. It features a new high-speed EBSD camera and a very sensitive EDS detector from EDAX. The microscope has also a STEM detector that allows an observation of the microstructure of metallic foils in transmission mode.

The hight-speed EBSD camera was co-financed by the European Union, by the European Regional Development Fund within the project 3DCOVER.

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New US patent for COMTES FHT

Dec 11, 2018

A new US-patent was granted to COMTES FHT on December 11th 2018. ... more

New equipment in COMTES FHT a.s.

Nov 26, 2018

COMTES FHT a.s. extended the equipment of its workshop with a new facility - a five axis milling center. This new machining center improves the possibilities of producing complex shapes and strengthens the overall capacity of the workshop. ... more